Labthink Instruments Co. Ltd. introduces PARAM CHY-C2 and PARAM CHY-CA Thickness Testers for monocrystal line silicon wafer thickness testing. The accuracy of these monocrystal line silicon wafer thickness testers can reach 0.1um. Both PARAM CHY-CA Thickness Tester and CHY-C2 Thickness Tester are high accuracy and high efficiency; furthermore, CHY-CA is equipped with automatic sample feeding for constant testing requirements.

Monocrystal line silicon wafer thickness testers consist of control, measurement and output systems. Measurement system measures thickness of silicon wafer and outputs corresponding electronic signal; control system is for parameter setting, modification, signal transfer and results display; output system calculates and prints the testing results.

These testers apply the most advanced measurement achievements, and are fully guaranteed with high accuracy and high result similarity. They are easy to operate and reduce human interferences to the utmost. Contact area, pressure, speed and other items comply with relevant standards. For a single test, measurement results can be typed; for several measurements, statistical results and their analysis can be printed.

Further details please feel free to contact Shirley Wu via:
TEL: 0086-531-85061080
FAX: 0086-531-85062108
EMAIL: trade2@labthink.cn
SKYPE: shirley-labthink
MSN: shirleywu_labthink@hotmail.com

More about Labthink(http://www.labthink.cn/en):
Labthink focusing on the laboratory testing instruments R&D and production and laboratory IT services, is dedicated to provide professional quality control solutions for customers in packaging, food, pharmaceutical, medical, daily chemistry, printing, adhesive, automotive, petrochemistry, bioscience, construction, new energy and other industries.

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