Labthink Instruments Co. Ltd. introduces PARAM CHY-C2 and PARAM CHY-CA Thickness Testers for monocrystal line silicon wafer thickness testing. The accuracy of these monocrystal line silicon wafer thickness testers can reach 0.1um. Both PARAM CHY-CA Thickness Tester and CHY-C2 Thickness Tester are high accuracy and high efficiency; furthermore, CHY-CA is equipped with automatic sample feeding [...]